Optical Manufacturing Test Platform

MAP-220C

Provides a flexible, more cost-effective compact platform for optical test switching and signal conditioning in optical device and sub-system development and manufacturing.

MAP-200 (Legacy)

Optical test and measurement platform optimized for cost-effective development and manufacturing of optical transmission network elements.

MAP-300

Third Generation optical test and measurement system that is optimized for compact cost-effective development and manufacturing of optical communications technology.

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